Summary report for "iac.princeton.edu" (monthly stats)
Quick navigation: Traffic summary Adwords keywords & texts Organic keywords Competitors
Title: The IAC provides training in microscopy and microanalysis techniques from specimen preparation to use of instrumentation
Description:
Description:
Advertising budget: N/A
This site in Alpha Directory: i ia iac
Approximate SE paid and organic traffic
| Traffic | Est. Cost | |
|---|---|---|
| Organic keywords | 56.59 | $163.93* |
| Paid keywords | N/A | N/A |
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Organic keywords
| Keyword | Cost Equiv. | Position | Keyword | Traffic | Position | Keyword | Position | |||||||
| 1. | multimode afm | $132.01 | 2 | 1. | philips cm | 19 | 4 | 1. | multimode afm | 2 | ||||
| 2. | di afm | $18.05 | 5 | 2. | multimode afm | 17 | 2 | 2. | quanta 200 | 3 | ||||
| 3. | philips cm | $8.87 | 4 | 3. | di afm | 5 | 5 | 3. | philips cm | 4 | ||||
| 4. | ion beam sputtering | $4.02 | 18 | 4. | quanta 200 | 5 | 3 | 4. | di afm | 5 | ||||
| 5. | cm200s | $0.31 | 18 | 5. | rigaku miniflex | 3 | 7 | 5. | rigaku miniflex | 7 | ||||
| 6. | quanta 200 | $0.24 | 3 | 6. | fei quanta | 2 | 7 | 6. | fei quanta | 7 | ||||
| 7. | rigaku miniflex | $0.15 | 7 | 7. | ion beam sputtering | 2 | 18 | 7. | iac training | 11 | ||||
| 8. | fei quanta | $0.12 | 7 | 8. | feg sem | 1 | 11 | 8. | feg sem | 11 | ||||
| 9. | feg sem | $0.07 | 11 | 9. | cm200s | 1 | 18 | 9. | afm training | 11 | ||||
| 10. | iac training | $0.02 | 11 | 10. | iac training | 0 | 11 | 10. | rigaku diffractometer | 13 |
Competitors for "iac.princeton.edu"
Fei.com: Electron Microscope | Electron Microscopes | Scanning Electron Microscope | SEM | Transmission Electron Microscope | TEM | DualBeam | Focused Ion Beam | FIB | FEI CompanyFEI is the world leader in electron microscopy technologies and applications that delivers subnanometer resolution for materials research, life sciences and electronics with resolution down to the sub-Ångström level. See our line of electron microscopes, including scanning electron microscopes (SEM), transmission electron microscopes (TEM), dualBeam instruments, and focused ion beam (FIB) instrume Keywords: fei; tem; microscope; scanning electron microscope; electron microscopy; Paid traffic cost: $0.77 |
Uni-ulm.de: Home - Universität UlmKeywords: endokrinologie; kiz; ulm germany; kryptologie; forschung; Paid traffic cost: N/A |
Rigaku.com: Global Rigaku WebsiteKeywords: rigaku; manufactures; xrd; saxs; vacuum feedthrough; Paid traffic cost: $5.04K |
Courts.ca.gov:Keywords: divorce; california divorce; paternity test california; self-help; filing for divorce; Paid traffic cost: N/A |
Ecatalog.squared.com: Schneider Electric US - Online CatalogOnline catalog for Schneider Electric USA products and services Keywords: square d; square d company; square d disconnect; square d breakers; square d starters; Paid traffic cost: N/A |
Microlab.berkeley.edu: Microlab Home PageMicrofabrication Laboratory University of California at Berkeley Keywords: microlab; vacuum system; print plotter; hp plotter; microfabrication; Paid traffic cost: N/A |
Microscopy.tamu.edu: Welcome! — MICKeywords: microscopy imaging; microscopy training; microscope training; gus assay; olympus confocal; Paid traffic cost: N/A |
4waveinc.com: 4Wave. Ion Beam Deposition, Ion Beam Milling, Etching, Plasma Processing Systems. Thin Film Coating and Etching ServicesKeywords: ion beam sputtering; deposition systems; 4wave; thin film coating services; broad beam; Paid traffic cost: $42.43 |
Oxfordplasma.de: Plasma and Ion Beam TechnologiesOxford Plasma Technology homepage: Plasma Etching (RIE, PE), Plasma Deposition (PECVD, remote PECVD), Sputtering, Ion Beam Etching (IBE, RIBE, CAIBE), Ion Beam Deposition (IBS, DIBS, DIBD), Photoresist Stripping, Inductive Coupled Plasma (ICP) Keywords: oxford instruments; electrostatic chuck; ion beam sputtering; end point detection; bosch process; Paid traffic cost: N/A |
Brukerafmprobes.com: AFM Probes | AFM Cantilever | AFM Tips - Bruker AFM ProbesBruker AFM Probes are expertise to built any probe and manufacturer of Scanning Probe Microscope (SPM) and Atomic Force Microscope (AFM) instrumentation Keywords: afm tips; afm probes; afm; fesp; afm probe; Paid traffic cost: $5.39K |